High capacity rack design,test points up to 3584;

High-end semiconductor CMOS Switching design,permitting no life limitation concern;

Auto-Learning and Automatic Program Generation of Open/Short,IC Clamping Diode;

Board View function can allocate defect device and pin instantly;

Practical quality management and statistic report available;

Built in System Self-Diagnostic function;

with IC Open TestJet technology,the best solution to cover most SMT IC or Connector lead soldering defect;

with IC Clamping Diode test and IC Reverse Check can enhance the testing coverage;

Leakage current and 3 point measurement is able to detect polarity of Capacitor;

1MHz AC signal for testing small Capacitor and Inductor;

Transistor,FET,SCR and Photo Coupler testing mode available;

Lead-Free soldering